| contributor | ITI, Rechnerarchitektur |
| creator | Kochte, Michael A. |
| Zoellin, Christian G. | |
| Imhof, Michael E. | |
| Wunderlich, Hans-Joachim | |
| date | 2008-01 |
| description | This paper presents a technique that limits the maximum number of specified bits of any pattern in a given test set. The outlined method uses algorithms similar to ATPG, but exploits the information in the test set to quickly find test patterns with the desired properties. The resulting test sets show a significant reduction in the maximum number of specified bits in the test patterns. Furthermore, results for commercial ATPG test sets show that even the overall number of specified bits is reduced substantially |
| identifier | http://www.informatik.uni-stuttgart.de/cgi-bin/NCSTRL/NCSTRL_view.pl?id=INPROC-2008-22&engl=1 |
| ISBN: ISBN-13: 978-0-7695-3110-6 | |
| ISBN: DOI: 10.1109/DELTA.2008.64 | |
| language | eng |
| publisher | IEEE Computer Society Conference Publishing Services |
| source | In: Proc. of the 4th IEEE International Symposium on Electronic Design, Test and Applications (DELTA 08); Hong Kong, SAR, China, 23-25 January 2008,, pp. 581-587 |
| subject | Reliability, Testing, and Fault-Tolerance (CR B.8.1) |
| test relaxation | |
| test generation | |
| tailored ATPG | |
| title | Test Set Stripping Limiting the Maximum Number of Specified Bits |
| type | Text |
| Article in Proceedings |